高分辨原子像中原子峰位置的精确自动判定与电极化畴的快速可视化
南虎，卢江波，刘明，井红梅，汤少杰，王大威，贾春林高分辨原子像中原子峰位置的精确自动判定与电极化畴的快速可视化
南虎1，卢江波1，刘明1，井红梅1，汤少杰2，王大威1*，贾春林1
（1.西安交通大学电子与信息工程学院，陕西 西安710049；2.西安邮电大学自动化学院，陕西 西安710121 ）
摘 要 针对材料原子尺度的量化研究正变得日益重要，而处理高分辨透射电子显微镜（HRTEM）像耗时耗力的现状，对计算机自动提取HRTEM像原子尺度信息的算法进行了研究，实现了HRTEM像中原子峰位置的自动准确提取；并在此基础上完成了布拉维格子的自动构建。利用前述两项关键图像信息，计算了钙钛矿钴氧化物中原子位置发生的周期性变化和铁电材料中电极化畴翻转等重要物理量，实现了对材料中晶胞尺度晶格形变的量化分析，以及形变和畴结构的快速可视化。当涉及大量图像处理时，其所实现的晶胞尺度晶格形变和畴结构的定量测量与快速可视化方法为分析材料原子及纳米尺度性能提供了一种强有力的分析手段。此外，自动提取HRTEM原子像信息也为后续探索模拟像和实验像的自动匹配及确定精确成像参数与真实原子位置打下了基础。
关键词 高分辨电子显微像；图像处理；单胞尺度晶格形变；可视化；定量表征中图分类号：TG115.21+5.3；O766+.1；TM22+1 文献标识码：A doi:10.3969/j.issn.1000-6281.2016.03.001
Automatic and accurate determination of atom peak location in high-resolution electron microscopy image and fast visualization of polarization domains*
NAN Hu1，LU Jiang-bo1，LIU Ming1，JING Hong-mei1，TANG Shao-jie2，WANG Da-wei1*，JIA Chun-lin1
（1. School of Electronics and Information Engineering, Xi’an Jiaotong University, Xi’an Shaanxi 710049；2. School of Automation, Xi’an University of Posts and Telecommunications，Xi’an Shaanxi 710121，China ）
Abstract Quantitative analysis of high-resolution (scanning) transmission electron microscopy images is becoming increasingly important. HereIn this study, we develop Ccomputer programs for efficiently processing high-resolution micrographs, automatically constructing Bravais lattice and extracting peak positions of atomswere developed, and therefore then substantially reducing reducedthe workload in analyzing such images. The program has been applied to (i) estimating the periodic displacements of atoms in LaBaCo2O5.5+δ; (ii) visualizing the nanoscale domain structures of ferroelectric PbTiO3; and (iii) obtaining the distribution of the tetragonal ratio c/a of individual cells in PbTiO3.We It is demonstratedthat such a tool is useful for the study of materials on the nano and atomic scale, and for comparing simulated and experimental images, which also constitutes the basis for future automatic matching of experimental and simulated high-resolution electron microscopy images.
Keywords high-resolution electron microscopy image；image processing；distortion on the atomic scale；visualization；quantitative characterization
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