[1]KABOLI S, NOEL P, CLÉMENT D, et al. On high-temperature evolution of passivation layer in Li–10 wt.% Mg alloy via in situ SEM-EBSD [J]. Science Advances, 2020, 6(50): eabd5708.
[2]张昊翔, 丁青青, 姚霞, 等. 热处理对一种新型析出强化型奥氏体不锈钢显微组织与性能的影响[J]. 电子显微学报, 2024, 43(5): 540-548.
[3]李菲祺, 吕俊霞, 程晓鹏, 等. 不同取向镍基单晶高温合金650 ℃原位拉伸[J]. 电子显微学报, 2024, 43(3): 295-302.
[4]TATE M L K, A new age in scanning electron microscopy: Applications in the life sciences [J]. Science, 2017, 358(6368): 1344-1344.
[5]BILEN B, SENER L T, ALBENIZ I, et al. Determination of ultrastructural properties of human carotid atherosclerotic plaques by scanning acoustic microscopy, Micro-computer tomography, scanning electron microscopy and energy dispersive X-Ray spectroscopy [J]. Scientific Reports, 2019, 9: 679.
[6]VERNON-PARRY K D. Scanning electron microscopy: An introduction [J]. III-Vs Review, 2000, 13(4): 40-44.
[7]LIMANDRI S, GALVÁN JOSA V, VALENTINUZZI M C, et al. 3D scanning electron microscopy applied to surface characterization of fluorosed dental enamel [J]. Micron, 2016, 84: 54-60.
[8]BOEHLERT C J, LI H, WANG L, et al. Slip system characterization of inconel 718: Using in-situ scanning electron microscopy [J]. Advanced Materials & Processes, 2010, 168(11-12): 41-46.
[9]LU J, CHEN B, LIU X, et al. 3D microstructure reconstruction of casting aluminum alloy based on serial block-face scanning electron microscopy [J]. Journal of Alloys and Compounds, 2019, 778: 721-730.
[10]JUNG J M, YOO J H, JEONG H J, et al. Three-dimensional characterization of SiC particle-reinforced Al composites using serial sectioning tomography and thermo-mechanical finite element simulation [J]. Metallurgical and Materials Transactions A, 2014, 45(12): 5679-5690.
[11]YUAN H, DE MOORTÈLE B V, EPICIER T. Accurate post-mortem alignment for focused ion beam and scanning electron microscopy (FIB-SEM) tomography [J]. Ultramicroscopy, 2021, 228: 113265.
[12]VERHOEVEN G. Taking computer vision aloft – archaeological three-dimensional reconstructions from aerial photographs with photoscan [J]. Archaeological Prospection, 2011, 18(1): 67-73.
[13]TAFTI A P, KIRKPATRICK A B, ALAVI Z, et al. Recent advances in 3D SEM surface reconstruction [J]. Micron, 2015, 78: 54-66.
[14]TAFTI A P, HOLZ J D, BAGHAIE A, et al. 3DSEM++: Adaptive and intelligent 3D SEM surface reconstruction [J]. Micron, 2016, 87: 33-45.
[15]WOODHAM R J. Photometric stereo: A reflectance map technique for determining surface orientation from image intensity [C]//Image Understanding Systems and Industrial Applications I: vol. 0155. SPIE, 1979: 136-143.
[16]WOODHAM R J. Photometric method for determining surface orientation from multiple images [J]. Optical Engineering, 1980, 19(1): 139-144.
[17]BARBIERI G, DA SILVA F P. Acquisition of 3D models with submillimeter-sized features from SEM images by use of photogrammetry: A dimensional comparison to microtomography [J]. Micron, 2019, 121: 26-32.
[18]GONTARD L C, LÓPEZ-CASTRO J D, GONZÁLEZ-ROVIRA L, et al. Assessment of engineered surfaces roughness by high-resolution 3D SEM photogrammetry [J]. Ultramicroscopy, 2017, 177: 106-114.
[19]SIHVONEN T, REINIKAINEN S P. Image based evaluation of textured 3DSEM models [J]. Ultramicroscopy, 2022, 238: 113518.
[20]DRZAZGA W, PALUSZYNSKI J, SLOWKO W. Three-dimensional characterization of microstructures in a SEM [J]. Measurement Science and Technology, 2006, 17(1): 28-31.
[21]BORZUNOV A A, KARAULOV V Y, KOSHEV N A, et al. 3D surface topography imaging in SEM with improved backscattered electron detector: Arrangement and reconstruction algorithm [J]. Ultramicroscopy, 2019, 207: 112830.
[22]BEIL W, CARLSEN I C. Surface reconstruction from stereoscopy and “shape from shading” in SEM images [J]. Machine Vision and Applications, 1991, 4(4): 271-285.
[23]PALUSZYŃSKI J, SLÓWKO W. Surface reconstruction with the photometric method in SEM [J]. Vacuum, 2005, 78(2): 533-537.
[24]PINTUS R, PODDA S, VANZI M. An automatic alignment procedure for a four-source photometric stereo technique applied to scanning electron microscopy [J]. IEEE Transactions on Instrumentation and Measurement, 2008, 57(5): 989-996.
[25]PINTUS R, PODDA S, VANZI M. Improvements in automated photometric stereo 3D SEM[J]. Microscopy and Microanalysis, 2008, 14(S2): 608-609.
[26]VYNNYK T, SCHULTHEIS T, FAHLBUSCH T, et al. 3D-measurement with the stereo scanning electron microscope on sub-micrometer structures [J]. Journal of the European Optical Society - Rapid Publications, 2010, 5(10038s). DOI:10.2971/jeos.2010.10038s.
[27]赵以恒, 张宜旭, 刘陵恩, 等. 扫描电镜多角度图像采集系统研究[J]. 电子显微学报, 2024, 43(6): 701-710.
[28]MIYAMOTO A, CHEN D, KANEKO S. Bootstrapping de-shadowing and self-calibration for scanning electron microscope photometric stereo [J]. Measurement Science and Technology, 2014, 25(10): 105402.
[29]MIYAMOTO A, MATSUSE H, KOUTAKI G. Robust surface reconstruction by design-guided SEM photometric stereo [J]. Measurement Science and Technology, 2017, 28(4): 045405.
[30]BORZUNOV A A, LUKYANENKO D V, RAU E I, et al. Reconstruction algorithm of 3D surface in scanning electron microscopy with backscattered electron detector [J]. Journal of Inverse and Ill-posed Problems, 2021, 29(5): 753-758.
[31]BAYAZID S M, BRODUSCH N, GAUVIN R. Investigation of the effect of magnification, accelerating voltage, and working distance on the 3D digital reconstruction techniques [J]. Scanning, 2020, 2020: e3743267.
[32]NEGGERS J, HÉRIPRÉ E, BONNET M, et al. Principal image decomposition for multi-detector backscatter electron topography reconstruction [J]. Ultramicroscopy, 2021, 227: 113200.
[33]GIARDINO M, MENON D M N, JANNER D L. Regularization techniques for 3D surface reconstruction from four quadrant backscattered electron detector images [J]. Ultramicroscopy, 2023, 250: 113746.
[34]WZOREK M, CZERWINSKI A, RATAJCZAK J, et al. Depth measurements of etch-pits in GaN with shape reconstruction from SEM images[J]. Journal of Microscopy, 2010, 237(3): 242-245.
[35]ESTELLERS V, THIRAN J P, GABRANI M. Surface reconstruction from microscopic images in optical lithography [J]. IEEE Transactions on Image Processing, 2014, 23(8): 3560-3573.
[36]HEMMLEB M, BETTGE D, DRIEHORST I, et al. 3D surface reconstruction with segmented BSE detector: New improvements and application for fracture analysis in SEM[C]//European Microscopy Congress 2016: Proceedings. John Wiley & Sons, Ltd, 2016: 489-490.
[37]SLÓWKO W, WIATROWSKI A, KRYSZTOF M. Detection of secondary and backscattered electrons for 3D imaging with multi-detector method in VP/ESEM [J]. Micron, 2018, 104: 45-60.
[38]SLÓWKO W. Specific features of the miniature ionisation BSE multi-detector unit for 3D imaging in environmental conditions[J]. Micron, 2019, 126: 102752.
[39]GONTARD L C, SCHIERHOLZ R, YU S, et al. Photogrammetry of the three-dimensional shape and texture of a nanoscale particle using scanning electron microscopy and free software [J]. Ultramicroscopy, 2016, 169: 80-88.
[40]EULITZ M, REISS G. 3D reconstruction of SEM images by use of optical photogrammetry software [J]. Journal of Structural Biology, 2015, 191(2): 190-196.
[41]KOZIKOWSKI P. Extracting Three-dimensional information from SEM images by means of photogrammetry [J]. Micron, 2020, 134: 102873.
[42]TONDARE V N, VILLARRUBIA J S, VLADÁR A E. Three-dimensional (3D) nanometrology based on scanning electron microscope (SEM) stereophotogrammetry [J]. Microscopy and Microanalysis, 2017, 23(5): 967-977.
[43]BAGHAIE A, TAFTI A P, OWEN H A, et al. SD-SEM: Sparse-dense correspondence for 3D reconstruction of microscopic samples [J]. Micron, 2017, 97: 41-55.
[44]CAO S, ZENG C Y, LI Y Y, et al. Quantitative FIB/SEM three-dimensional characterization of a unique Ni4Ti3 network in a porous Ni50.8Ti49.2 alloy undergoing a two-step martensitic transformation [J]. Materials Characterization, 2020, 169: 110595.
[45]CEGUERRA A V, DAY A C, RINGER S P. Assessing the spatial accuracy of the reconstruction in atom probe tomography and a new calibratable adaptive reconstruction [J]. Microscopy and Microanalysis, 2019, 25(2): 309-319.
[46]SKAUDZIUS R, ZARKOV A, SELSKIS A, et al. Wet-chemistry synthesis of shape-controlled Ag3PO4 crystals and their 3D surface reconstruction from SEM imagery [J]. Powder Technology, 2019, 345: 26-34.
[47]KANG K W, PEREDA M D, CANAFOGLIA M E, et al. Uncertainty studies of topographical measurements on steel surface corrosion by 3D scanning electron microscopy [J]. Micron, 2012, 43(2): 387-395.
[48]OMRANI E, TAFTI A P, FATHI M F, et al. Tribological study in microscale using 3D SEM surface reconstruction [J]. Tribology International, 2016, 103: 309-315.
[49]GONTARD L C, BATISTA M, SALGUERO J, et al. Three-dimensional chemical mapping using non-destructive SEM and photogrammetry [J]. Scientific Reports, 2018, 8(1): 11000.
[50]TONDARE V N. A concept for three-dimensional particle metrology based on scanning electron microscopy and structure-from-motion photogrammetry [J]. Journal of Research of the National Institute of Standards and Technology, 2020, 125: 125014.
[51]PODOR R, LE GOFF X, LAUTRU J, et al. Direct observation of the surface topography at high temperature with SEM [J]. Microscopy and Microanalysis, 2020, 26(3): 397-402.
[52]ZHANG X, GUO G, LI Z, et al. Superalloys fracture process inference based on overlap analysis of 3D models[J]. Communications Engineering, 2024, 3(1): 1-10.
[53]TAFTI A P, KIRKPATRICK A B, HOLZ J D, et al. 3DSEM: A 3D microscopy dataset [J]. Data in Brief, 2016, 6: 112-116.