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从跟随到引领——我国分析电子显微术的标准化进程与展望

权茂华*，柳得橹
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2025年 第44卷 第6期: 1000-6281（2025）06-704-10     下载地址：全文下载请到同方知网，万方数据库或重庆维普等数据库中下载！

从跟随到引领——我国分析电子显微术的标准化进程与展望

权茂华*，柳得橹

（1. 北京科技大学 材料科学与工程学院，北京 100083；2. 北京科技大学 材料国家级实验教学示范中心，北京 100083）

摘　要　　标准是一个国家经济活动和社会发展的技术支撑，是国家基础制度的重要方面，推动标准制定工作对于社会发展至关重要。本文以分析电子显微术为例，回顾了四十年来我国微束分析领域标准化工作的发展历程，用详实的资料揭示了我国在微束分析领域标准化工作从跟随国外标准到自主制定为主进而走到引领地位的转变，最后简要介绍了我国标准的实施情况、分析电子显微术标准化发展前景以及不足，以此呼吁更多微束分析行业的学者加入标准化工作，共同助力电子显微术的标准化发展。

关键词　　国家标准；国际标准；微束分析标准化；分析电子显微术

中图分类号：T652　　

文献标识码：A Doi:10.3969/j.issn.1000-6281.2025.06.00

 

From following to leading——Progress and prospect of the standardization for analytical electron microscopy in China

QUAN Maohua1，2*，LIU Delu1

(1. School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing 100083; 2. National Demonstration Center for Experimental Materials Education, University of Science and Technology Beijing, Beijing 100083, China)

Abstract　　Standards serve as vital technical safeguards that support a country's economic activities and social development, constituting an essential part of national infrastructure. Promoting the formulation of standards is therefore crucial for social development. This paper utilized analytical electron microscopy as a case study to review the evolution of standardization efforts in the field of microbeam analysis in China over the past four decades. Through detailed data presentation, it reveals China’s transformation from initially adopting foreign standards to primarily developing its own and ultimately advancing toward a leadership position. The paper also discusses the implementation of these standards within China, highlights future development prospects, and identifies current challenges in standardization for analytical electron microscopy. It aims to encourage more researchers to participate in standardization efforts and contribute collectively to the advancement of electron microscopy.

Keywords　　national standards; international standards; standardization of microbeam analysis; analytical electron microscopy