类四方BiFeO3薄膜中新型极化拓扑结构研究

陈双杰,唐云龙*, 朱银莲*, 马秀良

类四方BiFeO3薄膜中新型极化拓扑结构研究

陈双杰,唐云龙*, 朱银莲*, 马秀良

(1.中国科学院金属研究所沈阳材料科学国家研究中心,辽宁沈阳110016;2.中国科学技术大学材料科学与工程学院,辽宁沈阳110016;3. 松山湖材料实验室大湾区显微科学与技术研究中心,广东东莞523808; 4. 中国科学院物理研究所,北京100190)

    结合像差校正透射电子显微术和精密脉冲激光沉积技术,本文研究了生长在LaAlO3衬底上的单层铁电BiFeO3薄膜中应变调控和缺陷诱导的极化涡旋拓扑畴组态。HAADF-STEM成像揭示了薄膜中的层状BiO+ 面缺陷有助于稳定畴壁面为(100)型的类180度畴结构,并在这种新型的180度畴壁和LaAlO3界面相交区域诱导形成了半涡旋和极化涡旋拓扑结构。

关键词  半涡旋-涡旋;180 度畴壁;像差校正电子显微学;类四方BiFeO3薄膜

中图分类号:TB383;O77;TG115. 21+ 5. 3  文献标识码:A  doi:10.3969/j.issn.1000-6281.2023.04.004

 

Study on the novel polar topological structures of T-like BiFeO3 films

CHEN Shuang-jie1,2, TANG Yun-long1*, ZHU Yin-lian3*, MA Xiu-liang3,4

(1. Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang Liaoning 110016;2. School of Materials Science and Engineering, University of Science and Technology of China, Shenyang Liaoning 110016;3.Bay Area Center for Electron Microscopy, Songshan Lake Materials Laboratory, Dongguan Guangdong 523808, China; 4. Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China)

Abstract    Combined with aberration-corrected scanning transmission electron microscopy and pulsed laser deposition, this work presents the strai-mediated and defects-induced topological vortex domain configurations in monolayer ferroelectric BiFeO3 films grown on LaAlO3 substrates. HAADF-STEM images indicate that the 180°-like domain structures with (100)-type domain walls can be stabilizedby layered BiO+ planar defects. Besides, the semi-vortex and polar vortex topologies are generated at the intersection regions of the novel 180°-like domain walls and LaAlO3 interface.

Keywords  semi-vortex and vortex polarization; 180°domain wall; aberration-corrected scanning transmission electron microscopy; T-like BiFeO3film

 

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