碳点透射电镜表征方法的探究与实践

碳点透射电镜表征方法的探究与实践

梁国弘，邹少兰，石 璘，丁哲远，方 卉，翟 勇，刘士新，靳凤民^*

（1.天津大学化工学院，大型仪器测试平台，天津300350；2.天津大学地球系统科学学院，天津300072；3.天津大学化工学院，天津300350)

摘 要  碳点（CDs）由于其独特的物理、化学特性，近年来受到科技工作者的广泛关注。透射电镜（TEM）作为材料表征的重要工具之一，能够直观地展示材料微观形态和微区结构。本文以普遍廉价易得、低毒性的生物质材料作为原料制备CDs。针对CDs在TEM表征中制备易团聚、寻样困难、成像衬度低的问题，本文对样品制备方法、TEM观察方法及参数进行优化，探索最佳电镜图像拍摄条件，提出了一种倾斜载网制样、邻位寻样和扫描透射（STEM）成像表征CDs的方法，为CDs的TEM表征工作提供指导思路。

关键词 透射电镜；碳点；样品制备；邻位寻样；图像衬度

中图分类号：TB32；TH742；TB82；TG115.21  文献标识码：B  doi:10.3969/j.issn.1000-6281.2023.03.008

Characterization of carbon dots by transmission electron microscope

LIANG Guo-hong¹，ZOU Shao-lan¹，SHI Lin²，DING Zhe-yuan³，FANG Hui¹，ZHAI Yong¹，

LIU Shi-xin，JIN Feng-min^1*

( 1. Instrument analysis and testing center, School of Chemical Engineering and Technology, Tianjin University, Tianjin 300350；

2. School of Earth System Science, Tianjin University, Tianjin 300072；3. School of Chemical Engineering and Technology, Tianjin University, Tianjin 300350，China)

Abstract   Carbon dots (CDs) have attracted great attention in recent years due to their outstanding physical and chemical properties. As one of the important tools for material characterization, transmission electron microscope (TEM) can be used to characterize the micromorphology and micro-structure of materials. However, it is a great challenge to study carbon dots by TEM, including sample agglomeration, difficulty in finding samples, and low TEM image contrast. In this paper, we optimized the sample preparation, TEM observation and parameters. In order to quickly get high-quality TEM images, we introduced a special sample preparation technique and instrument operation techniques, which include the tilt of the copper grid about 10°, the neighborhood and the scanning transmission electron microscopy(STEM) imaging technique. This method provides a guideline for TEM characterization of CDs.

Keywords  transmission electron microscope; carbon dots; specimen preparation; finding sample by neighborhood; image contrast

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