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Journal of Chinese Electron Microscopy Society
The academic journal Chinese Journal of Electron Microscopy was founded in 1982 affiliated with Chinese Physics Society and sub-affiliated with Chinese Electron Microscopy Society (International recognized as Chinese Electron Microscope Society). Journal of Electron Microscopy is published bimonthly, printed in A4 paper and usually 80 pages.
Chinese Journal of Electron Microscopy is the sole academic journal which wholly devotes itself to the fundamental and applied research in the regime of microscopy in China. It covers the research fields of electron microscopy, scanning probe microscopy and other emerging theories on microscopy, experimental techniques and methods on microscopy. Instrumental manufacturing and development and their applications in materials science, physics, chemistry, geology, biology, nano-science and technologies, medical-science are also included. The journal’s main category includes:
1) “Letters”
Novel and significant research results, new knowledge and ideas or proposals on technological developments in electron microscopy;
2) “Regular Paper”
Theories, applications, instrumentation and new techniques as well as research experimental results on electron microscopy are in this category.
3) “Review”
Report the emerging trend, newly development and general review in the fields related to microscopy.
4) “News Rapid Report”
Report microscopy related news, activities and introduction of books etc.
"Journal of Chinese Electron Microscopy Society " (JCEMS), affiliated with the Chinese Electron Microscopy Society (CEMS), has been put out bimonthly since June 1982. Totaling 128 issues in 25 volumes have been published. Papers are printed both in Chinese or in English. Registrated No: ISSN1000-6281, CN11-2295/TN. 80 pages/issue. Editor-in-chief: academicians of Chinese Academy of Engineering Jun-en Yao (1996～), past editor-in-chiefs: academicians of Chinese Academy of Sciences Qian Linzhao（1980～1995） and Guo Kexin（1995～1996）; Advisor: Guo Kexin; Editorial Board: 47 members（including 10 academicians and 8 members from organizations in the United States, Japan or Hong Kong）
JCEMS carries original and review articles on electron optics, instrumentation, theories as well as applications of electron microscopy and other ultra-microscopy (scanning probe microscopy, confocal microscopy etc) in life science, material sciences, nano-technology, physics, chemistry, electronics, geology etc. JCEMS, the sole journal in this field in China, distributed all over the world in both hard and electronic copies.
http://www.periodicals.com.cn/qikan/periodical/dzxwxb.
JCEMS took the third place in the list of “Engineering and Technology Periodicals ” of “ Chinese Scientific and Technological Periodicals ” according the impact factor in 1996; has been listed in the “500 most frequently cited Chinese Scientific and Technological Periodicals” since 1994; accepted as the source journal of Chemical Abstracts, CA, since 1998, and listed as the 587th in the Table of “One thousand most frequently cited Journals in the would in the year of 1998” of CA.
JCEMS was awarded “ Excellent Periodical Prize ” by Beijing Press Publishing Bureau and Beijing Scientific Periodicals Society, and supported by “Special Fund for High Technology Periodical of China Association for Science and Technology” From 1999 to 2006 successively.
Editor in Chief： Jun-en Yao
Head of Editorial Office： NingChun Li
Tel： +86-10-82671519/ 62565522~3301
Fax &Tel：+86-10-82673560
E-mail：dzxwxb@blem.ac.cn
http:// www.periodicals.com.cn/qikan/periodical/dzxwxb
http://dzxwxb.ac.cn
Address：13 BeiErTiao ZhongGuanCun, Beijing 100080, China
PO Box 2724, Beijing, China
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